Absolute determination of the wavelength and spectrum of an extreme-ultraviolet beam by a Young's double-slit measurement

被引：26

作者：

Bartels, RA ^{[1
]}

Paul, A

Murnane, MM

Kapteyn, HC

Backus, S

Liu, Y

Attwood, DT

机构：

[1] Univ Colorado, Joint Inst Lab Astrophys, Boulder, CO 80309 USA

[2] Natl Inst Stand & Technol, Joint Inst Lab Astrophys, Boulder, CO 80309 USA

[3] Univ Calif Berkeley, Ctr Xray Opt, Lawrence Berkeley Natl Lab, Berkeley, CA 94720 USA

[4] Univ Calif Berkeley, Appl Sci & Technol Grad Grp, Berkeley, CA 94720 USA

来源：

OPTICS LETTERS | 2002年 / 27卷 / 09期

关键词：

D O I：

10.1364/OL.27.000707

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

The interference pattern produced by irradiation of a pair of pinholes with a beam contains information on both the spatial and the temporal coherence properties of the beam, as well as its power spectrum. We demonstrate experimentally for what is believed to be the first time that the spectrum of an extreme-ultraviolet (EUV) beam can be obtained from a measurement. of the interference pattern produced by a pinhole pair. This approach offers a convenient method of making absolute wavelength and relative spectral intensity calibrations in the EUV. (C) 2002 Optical Society of America.

引用

页码：707 / 709

页数：3

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