Exploration of the evolution of nanotechnology via mapping of patent applications

被引:27
作者
Igami, Masatsura [1 ,2 ]
机构
[1] Natl Inst Sci & Technol Policy, Chiyoda Ku, Tokyo 1000013, Japan
[2] Org Econ Cooperat & Dev, Directorate Sci Technol & Ind, Econ Anal & Stat Div, Paris, France
关键词
D O I
10.1007/s11192-007-1973-8
中图分类号
TP39 [计算机的应用];
学科分类号
081203 ; 0835 ;
摘要
This study explored the evolution of nanotechnology based on a mapping of patent applications. Citations among patent applications designated to the European Patent Office were intensively analysed. Approximately 4300 nanotechnology patent applications linked through citations were mapped. Fifteen domains of nanotechnology patent applications were found in the map in 2003. The domains cover a wide range of application fields; they are domains related to measurement and manufacturing; electronics; optoelectronics; biotechnology; and nano materials. Maps in several reference years registered the evolution of nanotechnology, where the breadth of application fields has been broadening over time. Direct and indirect knowledge flows among different domains of nanotechnology are seemingly small at the present. Each domain of nanotechnology is likely pushing the technological frontier within its own domain. The exception is sensing and actuating technologies on the nanometre scale. Direct and indirect knowledge flows to/from this domain describe their vital role in nanotechnology. Countries' specialisation was also analysed. Patent applications from the United States and the European Union cover a wide range of nanotechnology. Inventive activities in Japan are, however, strongly focusing on electronics. Intensive knowledge creation in specific technologies was found in Switzerland and Korea.
引用
收藏
页码:289 / 308
页数:20
相关论文
共 16 条
[1]   ATOMIC FORCE MICROSCOPE [J].
BINNIG, G ;
QUATE, CF ;
GERBER, C .
PHYSICAL REVIEW LETTERS, 1986, 56 (09) :930-933
[2]   SURFACE STUDIES BY SCANNING TUNNELING MICROSCOPY [J].
BINNING, G ;
ROHRER, H ;
GERBER, C ;
WEIBEL, E .
PHYSICAL REVIEW LETTERS, 1982, 49 (01) :57-61
[3]  
Faust K., 1994, SOCIAL NETWORK ANAL, V249
[4]   Citations, family size, opposition and the value of patent rights [J].
Harhoff, D ;
Scherer, FM ;
Vopel, K .
RESEARCH POLICY, 2003, 32 (08) :1343-1363
[5]  
Hoisl K., 2005, 20059 OECD STI
[6]   International nanotechnology development in 2003: Country, institution, and technology field analysis based on USPTO patent database [J].
Huang, Z ;
Chen, HC ;
Chen, ZK ;
Roco, MC .
JOURNAL OF NANOPARTICLE RESEARCH, 2004, 6 (04) :325-354
[7]  
IGAMI H, 2007, 20074 OECD STI
[8]  
IGAMI H, 2007, 20071 OECD STI
[9]   What is special about patent citations? Differences between scientific and patent citations [J].
Meyer, M .
SCIENTOMETRICS, 2000, 49 (01) :93-123
[10]  
Meyer M., 2006, SPRU 40 ANN C FUT SC