Interaction of As impurities with 30° partial dislocations in Si:: An ab initio investigation

被引:14
作者
Antonelli, A
Justo, JF
Fazzio, A
机构
[1] Univ Estadual Campinas, Inst Fis Gleb Wataghin, BR-13083970 Campinas, SP, Brazil
[2] Univ Sao Paulo, Escola Politecn, PSI, BR-05424970 Sao Paulo, Brazil
[3] Univ Sao Paulo, Inst Fis, BR-05315970 Sao Paulo, Brazil
关键词
D O I
10.1063/1.1466877
中图分类号
O59 [应用物理学];
学科分类号
摘要
We investigated through ab initio total energy calculations the interaction of arsenic impurities with the core of a 30degrees partial dislocation in silicon. It was found that when an arsenic atom sits in a crystalline position near the dislocation core, there is charge transfer from the arsenic towards the dislocation core. As a result, the arsenic becomes positively charged and the core negatively charged. The results indicate that the structural changes around the impurity are very small in both environments, namely, the crystal and the dislocation core. In this scenario, the interaction between arsenic and the core is essentially electrostatic, which eventually leads to arsenic segregation. The segregation energy was found to be as large as 0.5 eV/atom. Additionally, it was found that arsenic pairing inside the core is not energetically favorable. (C) 2002 American Institute of Physics.
引用
收藏
页码:5892 / 5895
页数:4
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