Manufacturability of chemical vapor deposition of copper

被引:32
作者
Nguyen, T
Charneski, LJ
Hsu, ST
机构
[1] Sharp Microlectron. Technol., Inc., Camas
关键词
D O I
10.1149/1.1837902
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
摘要
A reliable and reproducible copper deposition process using the chemical vapor deposition technique has been successfully developed using hexafluoroacetylacetone-based precursors. Effects of various process conditions such as temperature, distance from the wafer to the shower head, liquid precursor flow, etc., have been studied. Low resistivity (<2 mu Omega cm), high deposition rate (>200 nm/min), good adhesion, and good gap fill are routinely achieved. The quality copper film has <1% variation within 25 wafer batches for more than 500 wafers tested. The resulting copper deposition process is considered ready for integration into a manufacturing line.
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页码:2829 / 2833
页数:5
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