Spin-polarized scanning tunneling microscopy with antiferromagnetic probe tips

被引：46

作者：

Kubetzka, A

Bode, M

Pietzsch, O

Wiesendanger, R

机构：

[1] Univ Hamburg, Inst Appl Phys, D-20355 Hamburg, Germany

[2] Univ Hamburg, Microstruct Res Ctr, D-20355 Hamburg, Germany

来源：

PHYSICAL REVIEW LETTERS | 2002年 / 88卷 / 05期

关键词：

D O I：

10.1103/PhysRevLett.88.057201

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

We have performed low temperature spin-polarized scanning tunneling microscopy (SP-STM) of two monolayers Fe on W(110) using tungsten tips coated with different magnetic materials. We observe stripe domains with a magnetic period of 50 +/- 5 nm. Employing Cr as a coating material we recorded SP-STM images with an antiferromagnetic probe tip. The advantage of its vanishing dipole field is most apparent in external magnetic fields. This new approach resolves the problem of the disturbing influence of a ferromagnetic tip in the investigation of soft magnetic materials and superparamagnetic particles.

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