Comparison between different imaging modes in focussed ion beam instruments

被引:12
作者
Jiang, XR
Kruit, P
机构
[1] Zhejiang University, Dept. of Info. and Electron. Eng.
[2] Delft University of Technology, Department of Applied Physics, 2628 CJ Delft
关键词
D O I
10.1016/0167-9317(95)00238-3
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In a two-lens focussed ion beam instrument, one can choose to either have a crossover in between the lenses or not. For a representative instrument, it is shown that the optimized probe size of the non-crossover mode is smaller than that of the crossover mode. Both the lens aberrations and the statistical Coulomb effects are responsible for this effect. We analyzed the differences for a large range of beam currents and found that in the absence of statistical Coulomb interactions, the difference can be as much as a factor 1.6. In the presence of Coulomb interactions, the difference increases to a factor 1.8.
引用
收藏
页码:249 / 252
页数:4
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