Gallium distribution in the clathrates Sr8Ga16Ge30 and Sr4Eu4Ga16Ge30 by resonant diffraction

被引:55
作者
Zhang, YG
Lee, PL
Nolas, GS
Wilkinson, AP [1 ]
机构
[1] Georgia Inst Technol, Sch Chem & Biochem, Atlanta, GA 30332 USA
[2] Argonne Natl Lab, Adv Photon Source, SRI CAT, Argonne, IL 60439 USA
[3] Univ S Florida, Dept Phys, Tampa, FL 33620 USA
关键词
D O I
10.1063/1.1473236
中图分类号
O59 [应用物理学];
学科分类号
摘要
The distribution of gallium/germanium in the type-I clathrates Sr8Ga16Ge30 and Sr4Eu4Ga16Ge30 over the three crystallographically distinct framework sites has been determined by resonant diffraction. The analyses indicate a strong preference for the occupation of the 6c site by gallium. This is consistent with theoretical predictions, but contrary to the results of a previous neutron diffraction study. The gallium distribution, and, hence, the thermoelectric properties of these materials, may be amenable to manipulation by heat treatment. (C) 2002 American Institute of Physics.
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页码:2931 / 2933
页数:3
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