Plan-view observation of crack tips by focused ion beam transmission electron microscopy

被引：5

作者：

Saka, H

Abe, S

机构：

来源：

MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING | 1997年 / 234卷

关键词：

crack; plan-view observation; transmission electron microscopy; focused ion beam;

D O I：

10.1016/S0921-5093(97)00289-X

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

Cracks were introduced in a Si bulk single crystal by a Vickers indentation and foil specimens which contain the cracks in the plane of foil were prepared using a focused ion beam technique. The configuration of the cracks and the defect structures near the indentation were observed by transmission electron microscopy at 1 MV. The cracks were classified into two groups, a half penny crack and a lateral crack. The emission of dislocations near the crack tips was observed by both an in-situ heating and a post mortem heating experiment. (C) 1997 Elsevier Science S.A.

引用

页码：552 / 554

页数：3

共 6 条

[1] DIRECT OBSERVATION AND ANALYSIS OF INDENTATION CRACKING IN GLASSES AND CERAMICS [J].