Fractal roughness retrieval by integrated wavelet transform

被引:1
作者
Dogariu, A [1 ]
Boreman, G
Uozumi, J
Asakura, T
机构
[1] Univ Cent Florida, Creol, Sch Opt, Orlando, FL 32816 USA
[2] Hokkaido Univ, Res Inst Elect Sci, Sapporo, Hokkaido 0600812, Japan
[3] Hokkai Gakuen Univ, Fac Engn, Sapporo, Hokkaido 0640926, Japan
[4] Transylvania Univ, Dept Phys, Brasov, Romania
[5] Univ Cent Florida, Dept Elect Engn, Orlando, FL 32826 USA
关键词
integrated wavelet transform; rough surface; fractal surface; self-similar surface; self-affine surface; autocorrelation; scaling exponent;
D O I
10.1007/s10043-999-0293-z
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
An integrated-wavelet-transform (IWT) approach is proposed for the study of scattering from slightly rough surfaces that manifest scaling properties over a finite domain of correlation lengths. Instead of collecting angle-resolved intensities, values of the irradiance integrated over increasing areas are used to enhance the contributions of small irradiances at large scattering angles and to reduce the coherent noise. In the case of self-similar surfaces, the scaling behavior of IWT allows investigation of the surface roughness at various length scales. For the realistic case of self-affine surfaces, IWT permits the evaluation of the scaling exponent of the autocorrelation and also offers a direct way to evaluate the necessary length scale of the surface profile.
引用
收藏
页码:293 / 301
页数:9
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