The effect of RuO2/Pt hybrid bottom electrode structure on the leakage and fatigue properties of chemical solution derived Pb(ZrxTi1-x)O3 thin films

被引:44
作者
Kim, SH [1 ]
Hong, JG [1 ]
Streiffer, SK [1 ]
Kingon, AI [1 ]
机构
[1] N Carolina State Univ, Dept Mat Sci & Engn, Raleigh, NC 27695 USA
关键词
D O I
10.1557/JMR.1999.0135
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We have investigated the effect of RuO2 (10, 30, 50 nm)/Pt layered hybrid bottom electrode structure and film composition on the leakage and fatigue properties of chemical solution derived Pb(ZrxTi1-x)O-3 (PZT) thin films. It was observed that the use of high Ti content (Zr:Ti = 30:70) films with control of excess PbO at the thin RuO2 (10 nm)/Pt bottom electrode surface reduced leakage current and showed good fatigue properties with high remanent polarization compared to the use of high Zr films (Zr:Ti = 50:50) or thicker RuO2 (30, 50 nm)/Pt bottom electrodes. Typical P-E hysteresis behavior of PZT films was observed even at an applied voltage of 3 V, demonstrating greatly improved remanence and coercivity. Fatigue and breakdown characteristics of these modified PZT thin films (Zr:Ti = 30:70) on RuO2 (10 nm)/Pt, measured at 5 V, showed stable behavior, and less than 15% fatigue degradation was observed up to 10(10) cycles.
引用
收藏
页码:1018 / 1025
页数:8
相关论文
共 25 条
[1]   FERROELECTRIC (PB,LA)(ZR,TI)O3 EPITAXIAL THIN-FILMS ON SAPPHIRE GROWN BY RF-PLANAR MAGNETRON SPUTTERING [J].
ADACHI, H ;
MITSUYU, T ;
YAMAZAKI, O ;
WASA, K .
JOURNAL OF APPLIED PHYSICS, 1986, 60 (02) :736-741
[2]  
Al-Shareef H. N., 1994, Ferroelectrics, V152, P85, DOI 10.1080/00150199408017601
[3]   CONTRIBUTION OF ELECTRODES AND MICROSTRUCTURES TO THE ELECTRICAL-PROPERTIES OF PB(ZR0.53TI0.47)O-3 THIN-FILM CAPACITORS [J].
ALSHAREEF, HN ;
KINGON, AI ;
CHEN, X ;
BELLUR, KR ;
AUCIELLO, O .
JOURNAL OF MATERIALS RESEARCH, 1994, 9 (11) :2968-2975
[4]   PHASE EVOLUTION AND ANNEALING EFFECTS ON THE ELECTRICAL-PROPERTIES OF PB(ZR0.53TI0.47)O-3 THIN-FILMS WITH RUO2 ELECTRODES [J].
ALSHAREEF, HN ;
BELLUR, KR ;
AUCIELLO, O ;
KINGON, AI .
THIN SOLID FILMS, 1995, 256 (1-2) :73-79
[5]   ELECTRICAL-PROPERTIES OF FERROELECTRIC THIN-FILM CAPACITORS WITH HYBRID (PT,RUO2) ELECTRODES FOR NONVOLATILE MEMORY APPLICATIONS [J].
ALSHAREEF, HN ;
AUCIELLO, O ;
KINGON, AI .
JOURNAL OF APPLIED PHYSICS, 1995, 77 (05) :2146-2154
[6]  
ALSHAREEF HN, 1992, CERAM T, V25, P97
[7]   CONTROL OF STRUCTURE AND ELECTRICAL-PROPERTIES OF LEAD-ZIRCONIUM-TITANATE-BASED FERROELECTRIC CAPACITORS PRODUCED USING A LAYER-BY-LAYER ION-BEAM SPUTTER-DEPOSITION TECHNIQUE [J].
AUCIELLO, O ;
GIFFORD, KD ;
KINGON, AI .
APPLIED PHYSICS LETTERS, 1994, 64 (21) :2873-2875
[8]   RAPID THERMAL ANNEALING OF SOL-GEL DERIVED LEAD ZIRCONATE TITANATE THIN-FILMS [J].
CHEN, J ;
UDAYAKUMAR, KR ;
BROOKS, KG ;
CROSS, LE .
JOURNAL OF APPLIED PHYSICS, 1992, 71 (09) :4465-4469
[9]  
Chen SY, 1998, J AM CERAM SOC, V81, P97, DOI 10.1111/j.1151-2916.1998.tb02300.x
[10]  
CHUNG I, 1995, MATER RES SOC SYMP P, V361, P249