Prediction of Sublayer Depth in Turbid Media Using Spatially Offset Raman Spectroscopy

被引:29
作者
Macleod, N. A. [1 ]
Goodship, A. [2 ]
Parker, A. W. [1 ]
Matousek, P. [1 ]
机构
[1] Rutherford Appleton Lab, Cent Laser Facil, Sci & Techol Facil Council, Didcot OX11 0QX, Oxon, England
[2] Royal Natl Orthopaed Hosp, Inst Orthopaed & Musculoskeletal Sci UCL, Stanmore HA7 4LP, Middx, England
基金
英国工程与自然科学研究理事会;
关键词
D O I
10.1021/ac801219a
中图分类号
O65 [分析化学];
学科分类号
070302 [分析化学]; 081704 [应用化学];
摘要
We demonstrate experimentally the feasibility of monitoring the depth of optically thick layers within turbid media using spatially offset Raman spectroscopy (SORS) in combination with multivariate analysis. The method uses the deep penetration capability of SORS to characterize significantly thicker (by at least a factor of 2) layers than possible with conventional Raman spectroscopy. Typical relative accuracies were between 5 and 10%. The incorporation of depth information into a SORS experiment as an additional dimension allows pure spectra of each individual layer to be resolved using three-dimensional multivariate techniques (parallel factor analysis, PARAFAC) to accuracies comparable with the results of a two-dimensional analysis.
引用
收藏
页码:8146 / 8152
页数:7
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