Nanowire Single-photon detector with an integrated optical cavity and anti- reflection coating

被引:318
作者
Rosfjord, KM
Yang, JKW
Dauler, EA
Kerman, AJ
Anant, V
Voronov, BM
Gol'tsman, GN
Berggren, KK
机构
[1] MIT, Elect Res Lab, Cambridge, MA 02139 USA
[2] MIT, Lincoln Lab, Lexington, MA 02420 USA
[3] Moscow State Pedag Univ, Moscow 119435, Russia
来源
OPTICS EXPRESS | 2006年 / 14卷 / 02期
关键词
D O I
10.1364/OPEX.14.000527
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
We have fabricated and tested superconducting single-photon detectors and demonstrated detection efficiencies of 57% at 1550-nm wavelength and 67% at 1064 nm. In addition to the peak detection efficiency, a median detection efficiency of 47.7% was measured over 132 devices at 1550 nm. These measurements were made at 1.8K, with each device biased to 97.5% of its critical current. The high detection efficiencies resulted from the addition of an optical cavity and anti-reflection coating to a nanowire photodetector, creating an integrated nanoelectrophotonic device with enhanced performance relative to the original device. Here, the testing apparatus and the fabrication process are presented. The detection efficiency of devices before and after the addition of optical elements is also reported. (c) 2006 Optical Society of America.
引用
收藏
页码:527 / 534
页数:8
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