Dysnomia, a computer program for maximum-entropy method (MEM) analysis and its performance in the MEM-based pattern fitting

被引:259
作者
Momma, Koichi [1 ]
Ikeda, Takuji [2 ]
Belik, Alexei A. [1 ]
Izumi, Fujio [1 ]
机构
[1] Natl Inst Mat Sci, Tsukuba, Ibaraki 3050044, Japan
[2] Natl Inst Adv Ind Sci & Technol, Miyagino Ku, Sendai, Miyagi 9838551, Japan
关键词
maximum-entropy method; MEM-based pattern fitting; electron-density distribution; ELECTRON-DENSITY-DISTRIBUTION; ACCURATE CHARGE-DENSITY; STRUCTURE-REFINEMENT; POWDER DIFFRACTION; 3-DIMENSIONAL VISUALIZATION; RIETVELD REFINEMENT; CRYSTAL;
D O I
10.1017/S088571561300002X
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
A computer program, Dysnomia, for the maximum-entropy method (MEM) has been tested for the evaluation and advancement of MEM-based pattern fitting (MPF). Dysnomia is a successor to PRIMA, which was the only program integrated with RIETAN-FP for MPF. Two types of MEM algorithms, i.e., 0th-order single-pixel approximation and a variant of the Cambridge algorithm, were implemented in Dysnomia in combination with a linear combination of the "generalized F constraints" and arbitrary weighting factors for them. Dysnomia excels PRIMA in computation speed, memory efficiency, and scalability owing to parallel processing and automatic switching of discrete Fourier transform and fast Fourier transform depending on sizes of grids and observed reflections. These features of Dysnomia were evaluated for MPF analyses from X-ray powder diffraction data of three different types of compounds: taurine, Cu2CO3(OH)(2) (malachite), and Sr9In(PO4)(7). Reliability indices in MPF analyses proved to have been improved by using multiple F constraints and weighting factors based on lattice-plane spacings, d, in comparison with those obtained with PRIMA. (C) 2013 International Centre for Diffraction Data
引用
收藏
页码:184 / 193
页数:10
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