PIV measurements of a microchannel flow

被引:674
作者
Meinhart, CD [1 ]
Wereley, ST
Santiago, JG
机构
[1] Univ Calif Santa Barbara, Dept Mech & Environm Engn, Santa Barbara, CA 93106 USA
[2] Stanford Univ, Dept Mech Engn, Stanford, CA 94305 USA
关键词
D O I
10.1007/s003480050366
中图分类号
TH [机械、仪表工业];
学科分类号
0802 ;
摘要
A particle image velocimetry (PIV) system has been developed to measure velocity fields with order 1-mu m spatial resolution. The technique uses 200 nm diameter flow-tracing particles, a pulsed Nd:YAG laser, an inverted epi-fluorescent microscope, and a cooled interline-transfer CCD camera to record high-resolution particle-image fields. The spatial resolution of the PIV technique is limited primarily by the diffraction-limited resolution of the recording optics. The accuracy of the PIV system was demonstrated by measuring the known flow field in a 30 mu m x 300 mu m (nominal dimension) microchannel. The resulting velocity fields have a spatial resolution, defined by the size of the first window of the interrogation spot and out of plane resolution of 13.6 mu m x 0.9 mu m x 1.8 mu m, in the streamwise, wall-normal, and out of plane directions, respectively. By overlapping the interrogation spots by 50% to satisfy the Nyquist sampling criterion, a velocity-vector spacing of 450 nm in the wall-normal direction is achieved. These measurements are accurate to within 2% full-scale resolution, and are the highest spatially resolved PIV measurements published to date.
引用
收藏
页码:414 / 419
页数:6
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