Noninvasive bunch length monitor for femtosecond electron bunches

被引：14

作者：

Wang, DX ^{[1
]}

Kraft, GA ^{[1
]}

Price, E ^{[1
]}

Wood, PAD ^{[1
]}

Porterfield, DW ^{[1
]}

Crowe, TW ^{[1
]}

机构：

[1] UNIV VIRGINIA,SEMICONDUCT DEVICE LAB,CHARLOTTESVILLE,VA 22903

来源：

APPLIED PHYSICS LETTERS | 1997年 / 70卷 / 04期

关键词：

D O I：

10.1063/1.118423

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

A bunch length monitor for ultrashort (90 fs to 1 ps) electron bunches using a coherent synchrotron radiation detection techniques has been developed in a collaboration between the Thomas Jefferson National accelerator Facility (Jefferson Lab) and the University of Virginia. The noninvasive, high-resolution, high-sensitivity, low-noise monitor employs a state-of-the-art ''bandpass'' GaAs Schottky whisker diode operated at room temperature. This letter presents the monitor's performance. (C) 1997 American Institute of Physics.

引用

页码：529 / 531

页数：3

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