Effects of multi-product, small-sized production of LSIs packaged in various packages on the final test process efficiency and cost

被引：8

作者：

Fujioka, H

Nakamae, K

Higashi, A

机构：

来源：

INTERNATIONAL TEST CONFERENCE 1996, PROCEEDINGS | 1996年

关键词：

D O I：

10.1109/TEST.1996.557139

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

Effects of multi-product, small-sized production of LSIs packaged in various packages on the final test process efficiency and cost are evaluated through an event-driven simulation analysis which includes detailed parametric models.

引用

页码：793 / 799

页数：7