Analysis of the substrate influence on the ordering of epitaxial molecular layers: The special case of point-on-line coincidence

被引:40
作者
Mannsfeld, SCB [1 ]
Fritz, T [1 ]
机构
[1] Tech Univ Dresden, Inst Angew Photophys, D-01062 Dresden, Germany
来源
PHYSICAL REVIEW B | 2004年 / 69卷 / 07期
关键词
D O I
10.1103/PhysRevB.69.075416
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The physical structure of organic-inorganic heteroepitaxial thin films is usually governed by a fine balance between weak molecule-molecule interactions and a weakly laterally varying molecule-substrate interaction potential. Therefore, in order to investigate the energetics of such a layer system one has to consider large molecular domains. So far, layer potential calculations for large domains of organic thin films on crystalline substrates were difficult to perform concerning the computational effort which stems from the vast number of atoms which have to be included. Here, we present a technique which enables the calculation of the molecule-substrate interaction potential for large molecular domains by utilizing potential energy grid files. This technique allows the investigation of the substrate influence in systems prepared by organic molecular beam epitaxy (OMBE), like 3,4,9,10-perylenetetracarboxylicdianhydride on highly oriented pyrolytic graphite. For this system the so-called point-on-line coincidence was proposed, a growth mode which has been controversially discussed in literature. Furthermore, we are able to provide evidence for a general energetic advantage of such point-on-line coincident domain orientations over arbitrarily oriented domains which substantiates that energetically favorable lattice structures in OMBE systems are not restricted to commensurate unit cells or coincident super cells.
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