Molecular-dynamics investigation of the surface stress distribution in a Ge/Si quantum dot superlattice

被引:43
作者
Daruka, I [1 ]
Barabási, AL
Zhou, SJ
Germann, TC
Lomdahl, PS
Bishop, AR
机构
[1] Univ Notre Dame, Dept Phys, Notre Dame, IN 46556 USA
[2] Univ Calif Los Alamos Natl Lab, Appl Theoret & Computat Phys Div, Los Alamos, NM 87545 USA
[3] Univ Calif Los Alamos Natl Lab, Div Theoret, Los Alamos, NM 87545 USA
来源
PHYSICAL REVIEW B | 1999年 / 60卷 / 04期
关键词
D O I
10.1103/PhysRevB.60.R2150
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The surface stress distribution in an ordered quantum dot superlattice is investigated using classical molecular dynamics simulations. We find that the surface stress field induced by various numbers (from 1 to 9) of Ge islands embedded in a Si(001) substrate is in good agreement with analytical expressions based on pointlike embedded force dipoles, explaining the tendency of layered arrays to form vertically aligned columns. The shea-ranged nature of this stress field implies that only the uppermost layers affect the surface growth and that their influence decreases rapidly with layer depth. [S0163-1829(99)52028-6].
引用
收藏
页码:R2150 / R2153
页数:4
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