Investigation of the nanofibrillar morphology in silk fibers by small angle X-ray scattering and atomic force microscopy

Small angle X-ray scattering (SAXS) and atomic force microscopy (AFM) measurements have been shown to be consistent with the presence of nanofibrils in the cocoon silk of Bombyx mori and the dragline silk of Nephila clavipes. The transverse dimensions and correlation lengths range from >> 59 to 220 nm and in the axial direction from >> 80 to 230 nm. Also, the two-dimensional Fourier transforms of the height profiles of AFM topographic images of interior surfaces of B. mori follow a power law approximately the same as that for the Pored region of the SAXS data. In this manner, the AFM can be used to help remove ambiguity about the scatterers responsible for SAXS patterns. (C) 1999 Elsevier Science B.V. All rights reserved.