Electron field emission from nitrogenated tetrahedral amorphous carbon investigated by current imaging tunneling spectroscopy

被引：6

作者：

Cheah, LK ^{[1
]}

Shi, X ^{[1
]}

Liu, E ^{[1
]}

机构：

[1] Nanyang Technol Univ, Sch Elect & Elect Engn, Ion Beam Proc Lab, Singapore 639798, Singapore

来源：

APPLIED SURFACE SCIENCE | 1999年 / 143卷 / 1-4期

关键词：

nitrogenated tetrahedral amorphous carbon; filtered cathodic vacuum arc; field emission; current imaging tunneling microscopy; scanning tunneling microscopy;

D O I：

10.1016/S0169-4332(99)00078-1

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Electron field emission from nitrogenated tetrahedral amorphous carbon (ta-C:N) films with and without H ion surface post-treatment is investigated by current imaging tunneling spectroscopy (CITS). The post-treated ta-C:N film shows a lower threshold electric field, a higher emission current, and denser emission spots. The scanning tunneling microscopic (STM) images show more distinctive nanoclusters for the post-treated films compared to the untreated films. Scanning tunneling spectroscopy (STS) shows that a lower threshold electric field and a higher emission current density have been obtained from these clusters. Therefore, we believe that the electrons predominantly emit from the sp(3) rich clusters during field emission. (C) 1999 Elsevier Science B.V. All rights reserved.

引用

页码：309 / 312

页数：4

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