Phototransport spectroscopy of a-Si:H and μc-Si:H

被引:9
作者
Balberg, I [1 ]
机构
[1] Hebrew Univ Jerusalem, Racah Inst Phys, IL-91904 Jerusalem, Israel
关键词
D O I
10.1016/S0022-3093(01)00968-1
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
The spectroscopic methods used for the determination of the density of states (DOS) map in hydrogenated amorphous silicon (a-Si:H) and hydrogenated microcrystalline silicon (muc-Si:H) have a common drawback in that they do not give a reliable-unique fit of a model-map to experimental data. Only consistency checks of a given model by sets of data, from few types of measurements, can yield confidence in a model. In this paper we show that four sets of phototransport data can serve this purpose. thus yielding more reliable DOS maps than each of the currently popular methods. We also describe briefly a few achievements of our, above outlined, approach. (C) 2002 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:531 / 535
页数:5
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