Automated high-speed Mueller matrix scatterometer

被引:47
作者
Delplancke, F
机构
[1] Department of Optics and Acoustics, Université Libre de Bruxelles, Brussels
来源
APPLIED OPTICS | 1997年 / 36卷 / 22期
关键词
polarization; scatterometry; Mueller matrix; industrial control; surface roughness; polarimetry;
D O I
10.1364/AO.36.005388
中图分类号
O43 [光学];
学科分类号
070207 [光学]; 0803 [光学工程];
摘要
A new scatterometer-polarimeter is described. It measures the angular distribution of intensity and of the complete Mueller matrix of light scattered by rough surfaces and particle suspensions. The measurement time is 1 s/scattering angle in the present configuration but can he reduced to a few milliseconds with modified electronics. The instrument uses polarization modulation and a Fourier analysis of four detected signals to obtain the 16 Mueller matrix elements. This method is particularly well suited to online, real time, industrial process control involving rough surfaces and large particle suspensions jan arithmetic roughness or particle diameter of >1 mu m). Some results are given. (C) 1997 Optical Society of America.
引用
收藏
页码:5388 / 5395
页数:8
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