Acceleration sensitivity in beam-type electrostatic microresonators

被引:11
作者
Agarwal, Manu [1 ]
Park, Kwan K.
Chandorkar, Saurabh A.
Candler, Rob N.
Kim, Bongsang
Hopcroft, Matthew A.
Melamud, Renata
Kenny, Thomas W.
Murmann, Boris
机构
[1] Stanford Univ, Dept Elect Engn, Stanford, CA 94305 USA
[2] Stanford Univ, Dept Mech Engn, Stanford, CA 94305 USA
基金
美国国家科学基金会;
关键词
D O I
10.1063/1.2426884
中图分类号
O59 [应用物理学];
学科分类号
摘要
This letter examines the dependence of the natural frequency in a microelectromechanical resonator on externally applied acceleration. The particular structure studied is an electrostatically coupled, single anchored, double-ended silicon tuning fork. The authrors find that the acceleration dependence in this resonator is primarily due to axial stress on the resonator beams. Measurements show an acceleration sensitivity Delta f/f(0) of 7x10(-9)/g, which is comparable to values found for typical quartz crystal resonators. This result was obtained using dynamic (vibration) measurements, and validated using theoretical analysis and finite element simulations.
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页数:3
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