High-temperature persistent spectral hole burning of Eu3+-doped SiO2 glass prepared by the sol-gel process

被引:34
作者
Nogami, M
Abe, Y
机构
[1] Nagoya Institute of Technology, Showa Nagoya
关键词
D O I
10.1063/1.120361
中图分类号
O59 [应用物理学];
学科分类号
摘要
Persistent spectral hole burning was observed at temperatures higher than 77 K in SiO2 glass doped with the Eu3+ ions. The Eu3+-doped SiO2 glass was prepared using the sol-gel process of Si(OC2H5)(4) and EuCl3 . 6H(2)O. A persistent spectral hole was burned in the excitation spectrum of the F-7(0)-->D-5(0) transition of Eu3+ using a Rhodamine 6G dye laser, of which the hole width and depth were 1.6 cm(-1) and similar to 20% of the total intensity, respectively, at 77 K. Hole depth decreased with increasing temperature and disappeared above similar to 130 K. A possible mechanism for the hole burning is related to the local structure around Eu3+ and the residual OH and H2O in the glass. (C) 1997 American Institute of Physics. [S0003-6951(97)00850-4].
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页码:3465 / 3467
页数:3
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