Plasmonic Light Beaming Manipulation and its Detection Using Holographic Microscopy

被引：16

作者：

Lim, Yongjun ^{[1
,2
]}

Hahn, Joonku ^{[1
,2
]}

Kim, Seyoon ^{[1
,2
]}

Park, Junghyun ^{[1
,2
]}

Kim, Hwi ^{[3
]}

Lee, Byoungho ^{[1
,2
]}

机构：

[1] Seoul Natl Univ, Inter Univ Semicond Res Ctr, Natl Creat Res Ctr Act Plasmon Applicat Syst, Seoul 151744, South Korea

[2] Seoul Natl Univ, Sch Elect Engn, Seoul 151744, South Korea

[3] Samsung Elect, Gyeonggi Do 446920, South Korea

来源：

IEEE JOURNAL OF QUANTUM ELECTRONICS | 2010年 / 46卷 / 03期

关键词：

Holographic interferometry; plasmonics; surface plasmons; POINT-SPREAD FUNCTION; EXTRAORDINARY TRANSMISSION; SUBWAVELENGTH; DIFFRACTION; FIELD; OBJECTIVES; RESOLUTION; ALGORITHM; IMAGE;

D O I：

10.1109/JQE.2009.2033717

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Plasmonic off axis beaming and focusing of light by the use of asymmetric or non-periodic dielectric gratings around a metallic slit are experimentally demonstrated. The far-field probing was done by holographic microscopy. While the conventional near-field microscopes can probe only near-fields, our four-step phase-shift interferometer provides an efficient way of probing and reconstructing light paths coming out from the plasmonic devices. We hope our experimental work contributes to the practical applications of plasmonics such as optical interconnection and optical data storage.

引用

页码：300 / 305

页数：6

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