X-ray photoelectron spectroscopic characterization of Au collected with atom trapping on silica for atomic absorption spectrometry

被引:35
作者
Suzer, S [1 ]
Ertas, N [1 ]
Kumser, S [1 ]
Ataman, OY [1 ]
机构
[1] MIDDLE E TECH UNIV,DEPT CHEM,TR-06531 ANKARA,TURKEY
关键词
atom trapping of Au on silica; XPS; matrix shifts in binding energies;
D O I
10.1366/0003702971939064
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
The nature of analyte species collected on a cooled silica tube for atom-trapping atomic absorption spectrometric determination was investigated with the use of X-ray photoelctron spectroscopy (XPS). An XPS spectrum of gold deposited on atom-trapping silica tubes reveals a Au 4f(7/2) peak with a binding energy of 84.8 (+/-0.2) eV, which falls in the middle of the binding energies corresponding to zerovalent Au(0) at 84.0 eV and that of monovalent Au(I) at 85.2 eV, The corresponding energy for Au vapor deposited on silica is also 84.8 eV. Deposition of AuCl4- solution on silica results in two different Au 4f(7/2) peaks with binding energies of 84.8 and 87.3 eV corresponding, respectively, to Au(0) and Au(III), Deposition of the same AuCl4- solution on platinum metal again gives two peaks, this time at 84.4 and 87.0 eV energies corresponding again to Au(0) and Au(III), Combining all these data, we conclude that gold is trapped on atom-trapping silica surface as zerovalent Au(0) with a 0.8-eV matrix shift with respect to the metal surface, A similar 0.6-eV shift is also observed between the binding energy of 4f(7/2) Hg-2(2+) measured in Hg-2(NO3)(2) . 2H(2)O powder and that deposited on silica.
引用
收藏
页码:1537 / 1539
页数:3
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