High precision mechanical approach mechanism for a low temperature scanning tunneling microscope

被引:53
作者
Rust, HP
Buisset, J
Schweizer, EK
Cramer, L
机构
[1] Fritz-Haber-Inst. Max-Planck-Gesell., 14195 Berlin
[2] Physikalisches Institut, Universität Münster, 48149 Münster
[3] Ludger Cramer Messsoftware, 10827 Berlin
关键词
D O I
10.1063/1.1147846
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
A novel mechanical micropositioner has been developed for producing exact linear displacements in the nm range. Incorporated in a low temperature scanning tunneling microscope (STM), it is used as a coarse approach mechanism for the tunneling tip. The advantage of the design is the high accuracy of the linear motion and the absence of backlash. The design principle is discussed and its positioning accuracy and stability for STM imaging are demonstrated. (C) 1997 American Institute of Physics.
引用
收藏
页码:129 / 132
页数:4
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