Submicron, fully self-aligned HBT with an emitter geometry of 0.3 mu m

被引:14
作者
Hafizi, M [1 ]
机构
[1] HUGHES RES LABS,MALIBU,CA 90265
关键词
D O I
10.1109/55.596936
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A new fully self-aligned heterojunction bipolar transistor (HBT) process has been developed to fabricate submicron emitter geometries for applications requiring ultra low-power consumption and very high-speed performance, In this novel process approach the emitter, base and collector ohmic contacts are all self-aligned to the emitter mesa, Furthermore, the three ohmic contacts, i.e., emitter, base, and collector are defined and deposited in a single metalization step thereby simplifying the fabrication process, Using this new process we have fabricated HBT emitter geometries as small as 0.3 mu m(2) with RF performance of over 130 GHz, To our knowledge, this is the smallest HBT ever reported.
引用
收藏
页码:358 / 360
页数:3
相关论文
共 8 条
[1]  
BARINGER C, 1996, P IND PHOS REL MAT C, P64
[2]   SUBMICROMETER SELF-ALIGNED ALGAAS/GAAS HETEROJUNCTION BIPOLAR-TRANSISTOR PROCESS SUITABLE FOR DIGITAL APPLICATIONS [J].
LEE, WS ;
ENOKI, T ;
YAMAHATA, S ;
MATSUOKA, Y ;
ISHIBASHI, T .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1992, 39 (12) :2694-2700
[3]  
MASUDA H, 1995, P INP REL MAT, P644
[4]  
MATSUOKA Y, 1994, SIXTH INTERNATIONAL CONFERENCE ON INDIUM PHOSPHIDE AND RELATED MATERIALS: CONFERENCE PROCEEDINGS, P555, DOI 10.1109/ICIPRM.1994.328292
[5]   A NEW SELF-ALIGNMENT TECHNOLOGY USING BRIDGED BASE ELECTRODE FOR SMALL-SCALED ALGAAS/GAAS HBTS [J].
NAGATA, K ;
NAKAJIMA, O ;
NITTONO, T ;
YAMAUCHI, Y ;
ISHIBASHI, T .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1992, 39 (08) :1786-1792
[6]  
Nary KR, 1995, GAAS IC SYMPOSIUM TECHNICAL DIGEST 1995 - 17TH ANNUAL, P303, DOI 10.1109/GAAS.1995.529016
[7]   ULTRAHIGH F(T) AND F(MAX) NEW SELF-ALIGNMENT INP/INGAAS HBTS WITH A HIGHLY BE-DOPED BASE LAYER GROWN BY ALE/MOCVD [J].
SHIGEMATSU, H ;
IWAI, T ;
MATSUMIYA, Y ;
OHNISHI, H ;
UEDA, O ;
FUJII, T .
IEEE ELECTRON DEVICE LETTERS, 1995, 16 (02) :55-57
[8]  
TRAN L, 1993, GAAS IC SYMPOSIUM - TECHNICAL DIGEST 1993, P159, DOI 10.1109/GAAS.1993.394479