Design challenges of technology scaling

被引：599

作者：

Borkar, S ^{[1
]}

机构：

[1] Intel Corp, Circuit Res Lab, Santa Clara, CA 95051 USA

来源：

IEEE MICRO | 1999年 / 19卷 / 04期

关键词：

D O I：

10.1109/40.782564

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

IS PROCESS TECHNOLOGY MEETING THE GOALS PREDICTED BY SCALING THEORY? AN ANALYSIS OF MICROPROCESSOR PERFORMANCE, TRANSISTOR DENSITY, AND POWER TRENDS THROUGH SUCCESSIVE TECHNOLOGY GENERATIONS HELPS IDENTIFY POTENTIAL LIMITERS OF SCALING, PERFORMANCE, AND INTEGRATION.

引用

页码：23 / 29

页数：7