In-situ investigation of Fe ultrathin film growth by infrared transmission spectroscopy

被引：13

作者：

Fahsold, G ^{[1
]}

Bartel, A ^{[1
]}

Krauth, O ^{[1
]}

Lehmann, A ^{[1
]}

机构：

[1] Univ Heidelberg, Inst Angew Phys, D-69120 Heidelberg, Germany

来源：

SURFACE SCIENCE | 1999年 / 433卷

关键词：

infrared spectroscopy; iron; thin films;

D O I：

10.1016/S0039-6028(99)00168-5

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

IR-transmission spectroscopy is sensitive to charge transport and charge localization. Applied to low-dimensional metallic systems, this offers the possibility to investigate morphology on a nanometer scale during thin film growth by IR-optical methods. We performed in-situ IR-transmission spectroscopy during deposition of Fe on UHV-cleaved MgO(001) at 313 K and at 121 K. At thicknesses corresponding to a few monolayers of Fe, we find extremely weak m-absorption that is due to island morphology as known from our previous helium-atom-scattering results for the same system. For complete substrate coverages, the comparison of IR-transmittance with calculations for homogeneous films indicates significant attenuation of IR-absorption due to additional scattering of charge carriers at the irregular surface as a result of preceding island growth. (C) 1999 Elsevier Science B.V. All rights reserved.

引用

页码：162 / 166

页数：5

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