Nickel doping of boron-carbon alloy films and corresponding Fermi level shifts

被引:32
作者
Hwang, SD
Remmes, N
Dowben, PA
McIlroy, DN
机构
[1] UNIV NEBRASKA,DEPT PHYS,LINCOLN,NE 68588
[2] UNIV NEBRASKA,CTR MAT RES & ANAL,LINCOLN,NE 68588
[3] UNIV IDAHO,DEPT PHYS,MOSCOW,ID 83844
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1997年 / 15卷 / 03期
关键词
D O I
10.1116/1.580720
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
We have grown nickel doped boron-carbon alloy films by the technique of plasma enhanced chemical vapor deposition. The source gas closo-1,2-dicarbadodecaborane (orthocarborane) was used to grow the boron-carbon alloy, while nickelocene [Ni(C5H5)(2)] was used as the dopant source for nickel. With sufficient levels of Ni doping, diodes with characteristic tunnel diode behavior can be fabricated. The doping of nickel transformed a B5C p-type material, relative to lightly doped n-type silicon, to a strongly n-type material. In order to gain insight into the shift of the Fermi level of the Ni-doped material, we have examined the changes in the electronic structure of sodium doped films of the precursor molecule orthocarborane which has an icosahedral structure similar to that of boron-carbon materials. The establishment of unoccupied states at the Fermi level with Na doping of the orthocarborane films is consistent with the transformation of the p-type B5C to an n-type material with Ni doping. (C) 1997 American Vacuum Society.
引用
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页码:854 / 859
页数:6
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