Evaluating software development objectively

被引：14

作者：

Bassin, KA ^{[1
]}

Kratschmer, T

Santhanam, P

机构：

[1] IBM Corp, Thomas J Watson Res Ctr, Ctr Software Engn, Yorktown Hts, NY 10598 USA

[2] IBM Corp, Thomas J Watson Res Ctr, Software Engn Dept, Res, Yorktown Hts, NY 10598 USA

来源：

IEEE SOFTWARE | 1998年 / 15卷 / 06期

关键词：

D O I：

10.1109/52.730846

中图分类号：

TP31 [计算机软件];

学科分类号：

081202 ; 0835 ;

摘要：

By employing the Orthogonal Defect Classification scheme, the authors are able to support management with a firm handle on technical decision making. Through the extensive capture and analysis of defect semantics, one can obtain information on project management, test effectiveness, reliability, quality, and customer usage. The article describes th ree real-life case studies, and demonstrates the applicability of their techniques.

引用

页码：66 / +

页数：10