Differential interference contrast x-ray microscopy with submicron resolution

被引：83

作者：

Wilhein, T

Kaulich, B

Di Fabrizio, E

Romanato, F

Cabrini, S

Susini, J

机构：

[1] Univ Appl Sci, RheinAhrCampus Remagen, D-53424 Remagen, Germany

[2] ELETTRA Sincrotrone Trieste, ESCA Microscopy Beamline, I-34012 Trieste, Italy

来源：

APPLIED PHYSICS LETTERS | 2001年 / 78卷 / 14期

关键词：

D O I：

10.1063/1.1360776

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Progress in lithography and nanofabrication [E. Di Fabrizio , Nature (London) 401, 895 (1999)] has made it possible to apply differential interference contrast (DIC) in x-ray microscopy using an original x-ray doublet lens based on two specially developed zone plates. Switching from bright-field imaging (absorption contrast) to x-ray DIC, we observe, similar to visible-light microscopy, a dramatic increase in image contrast for weak absorbing samples. We anticipate that this technique will have a significant impact on x-ray imaging and may play a role comparable to DIC imaging in visible-light microscopy. (C) 2001 American Institute of Physics.

引用

页码：2082 / 2084

页数：3

共 25 条

[1] CHEMICAL CONTRAST IN X-RAY MICROSCOPY AND SPATIALLY RESOLVED XANES SPECTROSCOPY OF ORGANIC SPECIMENS [J].

ADE, H ;

ZHANG, X ;

CAMERON, S ;

COSTELLO, C ;

KIRZ, J ;

WILLIAMS, S .

SCIENCE, 1992, 258 (5084) :972-975

[2]

Allen R D, 1969, Z Wiss Mikrosk, V69, P193

[3] Low-dose phase contrast x-ray medical imaging [J].

Arfelli, F ;

Assante, M ;

Bonvicini, V ;

Bravin, A ;

Cantatore, G ;

Castelli, E ;

Dalla Palma, L ;

Di Michiel, M ;

Longo, R ;

Olivo, A ;

Pani, S ;

Pontoni, D ;

Poropat, P ;

Prest, M ;

Rashevsky, A ;

Tromba, G ;

Vacchi, A ;

Vallazza, E ;

Zanconati, F .

PHYSICS IN MEDICINE AND BIOLOGY, 1998, 43 (10) :2845-2852

[4]

Attwood D., 1999, SOFT XRAYS EXTREME U

[5]

BARRETT R, 1998, P SOC PHOTO-OPT INS, V3499, P80

[6]

Bonse U, 2000, AIP CONF PROC, V507, P69, DOI 10.1063/1.1291121

[7] AN X-RAY INTERFEROMETER [J].

BONSE, U ;

HART, M .

APPLIED PHYSICS LETTERS, 1965, 6 (08) :155-&

[8]

Charalambous P, 2000, AIP CONF PROC, V507, P625, DOI 10.1063/1.1291221

[9] Observation of microstructure and damage in materials by phase sensitive radiography and tomography [J].

Cloetens, P ;

PateyronSalome, M ;

Buffiere, JY ;

Peix, G ;

Baruchel, J ;

Peyrin, F ;

Schlenker, M .

JOURNAL OF APPLIED PHYSICS, 1997, 81 (09) :5878-5886

[10] An interferometric determination of the refractive part of optical constants for carbon and silver across soft x-ray absorption edges [J].

Joyeux, D ;

Polack, F ;

Phalippou, D .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1999, 70 (07) :2921-2926

← 1 2 3 →