Accurate de-embedding technique for on-chip small-signal characterization of high-frequency optical modulator

被引：1

作者：

Loi, KK

Sakamoto, I

Shao, XF

Hou, HQ

Liao, HH

Mei, XB

Cheng, AN

Tu, CW

Chang, WSC

机构：

[1] Dept. of Elec. and Comp. Engineering, University of California, San Diego, San Diego

[2] Mitsubishi Kasei Co., Ushiku

[3] Deacon Research, Palo Alto

[4] Sandia National Laboratories, Albuquerque

[5] Hewlett-Packard, San Jose

来源：

IEEE PHOTONICS TECHNOLOGY LETTERS | 1996年 / 8卷 / 03期

关键词：

D O I：

10.1109/68.481131

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A simple and accurate de-embedding technique has been developed for characterizing the microwave circuit behavior of noninsertable multiple quantum well waveguide modulators with on-chip two-port S-parameter measurements. The small-signal equivalent circuit parameters extracted from the error-corrected modulation response show an excellent agreement with both one-port microwave reflection coefficient measurement and CV data measured at 1 MHz.

引用

页码：402 / 404

页数：3