Sputtered silver oxide layers for surface-enhanced Raman spectroscopy

被引:78
作者
Büchel, D
Mihalcea, C
Fukaya, T
Atoda, N
Tominaga, J
Kikukawa, T
Fuji, H
机构
[1] Natl Inst Adv Ind Sci & Technol, Lab Adv Opt Technol, Tsukuba, Ibaraki 3058562, Japan
[2] TDK Corp, Data Storage Technol Ctr, Nagano 3850009, Japan
[3] Sharp Corp, Adv Technol Res Labs, Nara 6328567, Japan
关键词
D O I
10.1063/1.1389513
中图分类号
O59 [应用物理学];
学科分类号
摘要
We present results of reactively sputtered silver oxide thin films as a substrate material for surface-enhanced Raman spectroscopy (SERS). Herein, we show that deposited layers develop an increasingly strong SERS activity upon photoactivation at 488 nm. A benzoic acid/2-propanol solution was used to demonstrate that the bonding of molecules to SERS active sites at the surface can be followed by investigating temporal changes of the corresponding Raman intensities. Furthermore, the laser-induced structural changes in the silver oxide layers lead to a fluctuating SERS activity at high laser intensities which also affects the spectral features of amorphous carbon impurities. (C) 2001 American Institute of Physics.
引用
收藏
页码:620 / 622
页数:3
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