Interreflection errors in Fourier transform spectroscopy: a preliminary appraisal

被引:13
作者
Birch, JR [1 ]
Clarke, FJJ [1 ]
机构
[1] JB Res, Dorking RH4 2JG, Surrey, England
关键词
spectroscopy; Fourier transform; interreflection errors; infrared instrument validation; infrared standards;
D O I
10.1016/S0003-2670(98)00478-4
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
The presence of systematic ordinate errors in Fourier transform spectroscopy (FTS) is discussed, largely in terms of interreflection effects between the various interfaces of a two-beam interferometer and its adjacent optical components. Seven distinct categories of interreflection are specified and some consequences are noted. Certain types of optical filter are described which can be used diagnostically to distinguish between ordinate errors arising from interreflections and the intrinsic ordinate errors. The latter are those that remain when the interreflection effects have been removed by optical modifications. A strategy for achieving this is suggested. Finally, a theoretical model is being considered as a general way of handling a complicated problem. (C) 1999 The National Physical Laboratory. Published by Elsevier Science B.V. All rights reserved.
引用
收藏
页码:369 / 378
页数:10
相关论文
共 11 条
  • [1] Birch J.R., 1995, SPECTROSC EUROPE, V7, P16
  • [2] IMPERFECT OPTICAL FIGURE IN FOURIER-TRANSFORM SPECTROSCOPY
    BIRCH, JR
    [J]. INFRARED PHYSICS, 1990, 30 (02): : 155 - 159
  • [3] THE REMOVAL OF DETECTOR PORT RADIATION EFFECTS IN POWER TRANSMISSION OR REFLECTION FOURIER-TRANSFORM SPECTROSCOPY
    BIRCH, JR
    NICOL, EA
    [J]. INFRARED PHYSICS, 1987, 27 (03): : 159 - 165
  • [4] AN INTERCOMPARISON OF MEASUREMENT TECHNIQUES FOR THE DETERMINATION OF THE DIELECTRIC-PROPERTIES OF SOLIDS AT NEAR MILLIMETER WAVELENGTHS
    BIRCH, JR
    SIMONIS, GJ
    AFSAR, MN
    CLARKE, RN
    DUTTA, JM
    FROST, HM
    GERBAUX, X
    HADNI, A
    HALL, WF
    HEIDINGER, R
    HO, WW
    JONES, CR
    KONIGER, F
    MOORE, RL
    MATSUO, H
    NAKANO, T
    RICHTER, W
    SAKAI, K
    STEAD, MR
    STUMPER, U
    VIGIL, RS
    WELLS, TB
    [J]. IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1994, 42 (06) : 956 - 965
  • [5] BIRCH JR, 1978, INFRARED PHYS, V18, P613, DOI 10.1016/0020-0891(78)90078-7
  • [6] BIRCH JR, 1979, INFRARED MILLIMETER, V2, pCH3
  • [7] Chamberlain J., 1979, PRINCIPLES INTERFERO
  • [8] The absolute calibration of mid-infrared transmittance standards
    Clarke, FJJ
    [J]. ANALYTICA CHIMICA ACTA, 1999, 380 (2-3) : 127 - 141
  • [9] Griffiths P.R., 1986, FOURIER TRANSFORM IN
  • [10] Heavens O. S., 1955, OPTICAL PROPERTIES T