Low-frequency spectral enhancement of THz electromagnetic waves emitted from InAs surface with increased excitation intensity

被引:10
作者
Yano, R
Gotoh, H
Hirayama, Y
Miyashita, S
Kadoya, Y
Kusuda, K
Yamanishi, M
机构
[1] NTT Corp, NTT Basic Res Labs, Atsugi, Kanagawa 2430198, Japan
[2] NTT Adv Technol, Atsugi, Kanagawa 2430198, Japan
[3] Hiroshima Univ, Grad Sch Adv Sci Matter, Higashihiroshima 7398530, Japan
关键词
D O I
10.1063/1.1642733
中图分类号
O59 [应用物理学];
学科分类号
摘要
We studied the excitation intensity dependence of the spectrum of the THz electromagnetic waves emitted from the surface of InAs excited by a femtosecond laser pulse. An enhancement of the spectral amplitude in the low-frequency regime (<0.6 THz) of the THz electromagnetic waves was observed when the excitation intensity was increased. To clarify the mechanism of the above phenomenon, we also performed THz wave emission experiments using a semi-insulating-GaAs sample. Due to the difference of the band-gap energies between InAs and GaAs, carriers excited to the conduction band experience different relaxation processes when they are excited by a laser pulse with a photon energy of 1.5 eV. Comparison of the experimental results for InAs and GaAs showed that the suppression of the intra-band relaxation induces the enhancement of the amplitude of the THz spectrum in the low-frequency regime for InAs. (C) 2004 American Institute of Physics.
引用
收藏
页码:2141 / 2145
页数:5
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