Direct method for shear moduli calculation from quartz crystal resonator measurements

被引：6

作者：

Behling, C ^{[1
]}

Lucklum, R ^{[1
]}

Hauptmann, P ^{[1
]}

机构：

[1] Univ Magdeburg, D-39016 Magdeburg, Germany

来源：

PROCEEDINGS OF THE 1998 IEEE INTERNATIONAL FREQUENCY CONTROL SYMPOSIUM | 1998年

关键词：

D O I：

10.1109/FREQ.1998.717995

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Quartz crystal resonator measurements can be used for polymer material characterization. The non-gravimetric behavior of these resonators, i.e. the dependence of the electrical response of polymer coated quartz resonators on the polymer shear modulus, is exploited for the determination of viscoelastic material properties of the coating. Previously reported methods applied an electrical admittance analysis together with difficult and time-consuming data fit procedures to calculate the film shear modulus. This contribution presents a new direct method for the determination of complex shear moduli of polymer films from quartz crystal resonator measurements which allows a fast calculation of the shear parameters.

引用

页码：823 / 830

页数：8