X-ray photoelectron spectroscopy on zeolites and related materials

被引:72
作者
Stocker, M
机构
[1] SINTEF Chemistry in Oslo, Department of Hydrocarbon Process Chemistry, N-0314 Oslo, Blindern
来源
MICROPOROUS MATERIALS | 1996年 / 6卷 / 5-6期
关键词
X-ray photoelectron spectroscopy; zeolites; molecular sieves; review;
D O I
10.1016/0927-6513(96)00034-X
中图分类号
O69 [应用化学];
学科分类号
081704 ;
摘要
XPS has become an important tool for the characterization of surface properties of zeolites and related materials. Since catalysis is mainly a surface phenomenon detailed knowledge of the behavior of zeolites and related materials is valuable with respect to the application of those materials in connection with catalyzed chemical reactions and processes. After a short introduction of the basic principles of XPS some general aspects are addressed before the more specific items related to XPS investigations of zeolites and related materials are discussed. These chapters are followed by the characteristics of zeolites and related materials studied by XPS in relation to the surface properties, the nature and electronic state of metals, their redox behavior as well as investigations of metal clusters/complexes in zeolites and related materials. Furthermore, the dispersion of metals and metal oxides, the application in catalysis, the coke formation and finally the acidity and basicity of zeolites will be addressed.
引用
收藏
页码:235 / 257
页数:23
相关论文
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