X-ray fluorescence measurements of advanced organic materials

被引:4
作者
Kurmaev, EZ
Moewes, A [1 ]
Endo, K
Ederer, DL
机构
[1] Univ Saskatchewan, Dept Phys & Engn Phys, Saskatoon, SK S7N 5E2, Canada
[2] Russian Acad Sci, Ural Div, Inst Met Phys, Ekaterinburg 620219, Russia
[3] Kanazawa Univ, Fac Sci, Dept Chem, Kanazawa, Ishikawa 9201192, Japan
[4] Tulane Univ, Dept Phys, New Orleans, LA 70118 USA
基金
美国国家科学基金会; 俄罗斯基础研究基金会;
关键词
X-ray emission spectra; electronic structure; organic advanced materials;
D O I
10.1016/S0368-2048(00)00388-1
中图分类号
O433 [光谱学];
学科分类号
0703 ; 070302 ;
摘要
The results of X-ray fluorescence measurements of advanced organic materials (organic semiconductors, superconductors and molecular magnets) are presented. The electronic structure and chemical bonding of these materials is discussed basing on comparison of X-ray emission spectra with spectra of reference samples and our MO LCAO calculations. (C) 2001 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:889 / 894
页数:6
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