Force interaction in low-amplitude ac-mode atomic force microscopy: cantilever simulations and comparison with data from Si(111)7x7

被引:17
作者
Erlandsson, R [1 ]
Olsson, L [1 ]
机构
[1] Linkoping Univ, Dept Phys & Measurement Technol, Appl Phys Lab, S-58183 Linkoping, Sweden
来源
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING | 1998年 / 66卷 / Suppl 1期
关键词
D O I
10.1007/s003390051260
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Numerical simulations of cantilever resonance spectra are presented using a model for the tip-surface interaction including a long-range van der Waals force, an interatomic force described by a Morse function, and the treatment of surface elasticity as a linear spring. Simulated resonance spectra are compared with experimental data obtained from the interaction between an oscillating tungsten tip and a Si(111)7 x 7 surface at different tip-to-surface separations. The simulations show that the tip probes only the attractive part of the interaction force, and that interatomic binding energy variations on the order of 1 eV can be resolved without including energy dissipation at the surface in the model.
引用
收藏
页码:S879 / S883
页数:5
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