X-ray microprobe system for XRF analysis and spectroscopy at SPring-8 BL39XU

被引：27

作者：

Hayakawa, S ^{[1
]}

Goto, S

Shoji, T

Yamada, E

Gohshi, Y

机构：

[1] Univ Tokyo, Dept Appl Chem, Sch Engn, Bunkyo Ku, Tokyo 113, Japan

[2] RIGAKU Ind Corp, Takatsuki, Osaka 569, Japan

[3] JASRI, SPring8, Kamigori, Hyogo 67812, Japan

来源：

JOURNAL OF SYNCHROTRON RADIATION | 1998年 / 5卷

关键词：

X-ray fluorescence; SPring-8; wavelength-dispersive spectrometers; trace-element analysis;

D O I：

10.1107/S090904959701892X

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

An X-ray microprobe system for X-ray fluorescence (XRF) analysis and spectroscopy has been developed at SPring-8 BL39XU: it comprises an X-ray focusing or collimation system, energy-dispersive (ED) and wavelength-dispersive (WD) XRF spectrometers, and a sample-scanning system. The conventional ED spectrometer will be utilized for qualitative and quantitative trace-element analysis, and the WD spectrometer will be used both for trace-element analysis and XRF spectroscopy. A combination of monochromated undulator radiation and the WD spectrometer will enable resonant XRF spectroscopy using brilliant hard X-ray undulator radiation.

引用

页码：1114 / 1116

页数：3

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