Element specific magnetization of buried interfaces probed by diffuse X-ray resonant magnetic scattering

被引：90

作者：

MacKay, JF

Teichert, C

Savage, DE

Lagally, MG

机构：

[1] University of Wisconsin, Madison, WI

来源：

PHYSICAL REVIEW LETTERS | 1996年 / 77卷 / 18期

关键词：

D O I：

10.1103/PhysRevLett.77.3925

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

The magnetization of buried interfaces and its relationship to interfacial roughness is probed for Co films and Co/Cu multilayers using diffuse x-ray resonant magnetic scattering, a method in which the average diffusely scattered x-ray intensity is compared with the component that reflects magnetic scattering. The comparison demonstrates that the boundary between magnetic and nonmagnetic layers is smoother than the interfacial roughness, with short-wavelength roughness less effective in magnetic scattering than longer-wavelength roughness.

引用

页码：3925 / 3928

页数：4

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