Structural studies on surfactant-templated silica films grown at the air/water interface

被引：34

作者：

Edler, KJ ^{[1
]}

Goldar, A

Hughes, AV

Roser, SJ

Mann, S

机构：

[1] Univ Bath, Dept Chem, Bath BA2 7AY, Avon, England

[2] Univ Bristol, Sch Chem, Bristol BS8 1TS, Avon, England

来源：

MICROPOROUS AND MESOPOROUS MATERIALS | 2001年 / 44卷

基金：

英国工程与自然科学研究理事会;

关键词：

films; mesostructure; formation mechanism; reflectivity;

D O I：

10.1016/S1387-1811(01)00247-5

中图分类号：

O69 [应用化学];

学科分类号：

081704 ;

摘要：

In situ characterisation of a growing surfactant-templated silica film has been carried out by X-ray reflectivity, diffuse X-ray scattering from the surface. Brewster angle microscopy and surface pressure measurements. The results indicate an unexpected film growth mechanism where layered structures form in solution and diffuse to the interface after some critical induction period. (C) 2001 Elsevier Science B.V. All rights reserved.

引用

收藏

页码：661 / 670

页数：10

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