Applications for infrared imaging equipment in photovoltaic cell, module, and system testing

被引：43

作者：

King, DL ^{[1
]}

Kratochvil, JA ^{[1
]}

Quintana, MA ^{[1
]}

McMahon, TJ ^{[1
]}

机构：

[1] Sandia Natl Labs, Albuquerque, NM 87123 USA

来源：

CONFERENCE RECORD OF THE TWENTY-EIGHTH IEEE PHOTOVOLTAIC SPECIALISTS CONFERENCE - 2000 | 2000年

关键词：

D O I：

10.1109/PVSC.2000.916175

中图分类号：

TE [石油、天然气工业]; TK [能源与动力工程];

学科分类号：

0807 ; 0820 ;

摘要：

Anomalous temperature distributions are often an indication of atypical behavior in a device under investigation. Portable infrared (IR) imaging systems (cameras) now provide a convenient method for measuring both absolute and relative temperature distributions on small and large components with a high degree of temperature and spatial resolution. This diagnostic tool can be applied during the development, production, monitoring, and repair of photovoltaic cells, modules, and systems. Planar objects with nearly uniform material composition are ideally suited for analysis using IR imaging. This paper illustrates investigations of localized shunting in cells, resistive solder bonds in field-aged modules, module bypass diode functionality, reverse-bias (hot spot) heating in modules, temperature distributions in flat-plate and concentrator modules, batteries during charging, and electronic component temperature in power processing equipment.

引用

页码：1487 / 1490

页数：4