A study of adhesion forces by atomic force microscopy

被引：30

作者：

Jacquot, C ^{[1
]}

Takadoum, J ^{[1
]}

机构：

[1] ENSMM, Lab Microanal Surfaces, F-25030 Besancon, France

来源：

JOURNAL OF ADHESION SCIENCE AND TECHNOLOGY | 2001年 / 15卷 / 06期

关键词：

adhesion force; AFM; surface energy; electron-acceptor parameter; electron-donor parameter;

D O I：

10.1163/156856101750430422

中图分类号：

TQ [化学工业];

学科分类号：

0817 ;

摘要：

An atomic force microscope (AFM) was used to investigate Si3N4 tip interactions with various materials in four different liquid media (water, ethanol, ethylene glycol, and formamide). The adhesion forces calculated using surface energies and the values measured experimentally were compared. For all materials, the calculated adhesion force closely correlated with AFM measurements, except in water. In the case of water, the AFM experiments showed strong adhesion. whereas theoretically (van Oss-Chaudhury-Good model) repulsion is predicted. The difference observed is discussed in terms of the chemical interactions between Si3N4 and water.

引用

页码：681 / 687

页数：7

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