Ferromagnetic resonance linewidth for NM/80NiFe/NM films (NM = Cu, Ta, Pd and Pt)

被引:160
作者
Mizukami, S [1 ]
Ando, Y [1 ]
Miyazaki, T [1 ]
机构
[1] Tohoku Univ, Grad Sch Engn, Dept Appl Phys, Sendai, Miyagi 9808579, Japan
关键词
ferromagnetic resonance; linewidth; permalloy; Gilbert damping parameter;
D O I
10.1016/S0304-8853(00)01097-0
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The out-of-plane angular dependence of ferromagnetic resonance linewidth of non-magnetic metal (NM)/80NiFe(Py)(20-100 Angstrom)/NM (NM = Cu, Ta, Pd and Pt) sputtered films were measured for the investigation of magnetic damping. The linewidth for NM = Pd and Pt were larger than that of NM = Cu and Ta. Analysis of the angular dependence of the linewidth using Landau-Lifshitz-Gilbert equation with magnetic inhomogeneities showed that the Gilbert damping parameter, G, for NM = Pt and Pd were larger than the bulk value of Py and were dependent on the thickness of Py. G, for NM = Cu and Ta. were same as the bulk value. These results show that the magnetization precession of Py layers sandwiched by Pt or Pd layers damps more rapidly. (C) 2001 Elsevier Science BY. All rights reserved.
引用
收藏
页码:1640 / 1642
页数:3
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