Effect of acidic and basic surface dipoles on the depletion layer of indium tin oxide as measured by in-plane conductance

被引:22
作者
Swint, AL
Bohn, PW
机构
[1] Univ Illinois, Dept Chem, Urbana, IL 61801 USA
[2] Univ Illinois, Frederick Seitz Mat Res Lab, Urbana, IL 61801 USA
关键词
D O I
10.1063/1.1638630
中图分类号
O59 [应用物理学];
学科分类号
摘要
Four-point probe measurements of indium tin oxide (ITO) films demonstrate the ability to decrease or increase in-plane resistance by surface treatment with acids or bases, respectively. Treatment of ITO surfaces with solutions of varying pH indicates that the degree of protonation or hydroxylation of basic or acidic surface sites, respectively, alters the n-type depletion layer depth and consequently affects the in-plane conductance. Modifying the ITO surface with a series of nearly constant-pH tetraalkylammonium hydroxide species reveals that the in-plane conductance is also modulated by the size of the adsorbed surface dipole layer. The overall change in in-plane conductance upon acid or base treatment is attributed to the net effect of surface charge and adsorbed dipole layer magnitude. Due to the intrinsically high signal-to-noise ratio of the in-plane resistance, these observations have implications for the use of ITO in condensed phase sensing applications. (C) 2004 American Institute of Physics.
引用
收藏
页码:61 / 63
页数:3
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