High efficiency n-type Si solar cells on Al2O3-passivated boron emitters

被引:324
作者
Benick, Jan [1 ]
Hoex, Bram [2 ]
van de Sanden, M. C. M. [2 ]
Kessels, W. M. M. [2 ]
Schultz, Oliver [1 ]
Glunz, Stefan W. [1 ]
机构
[1] Fraunhofer Inst Solar Energy Syst, D-79110 Freiburg, Germany
[2] Eindhoven Univ Technol, Dept Appl Phys, NL-5600 MB Eindhoven, Netherlands
关键词
D O I
10.1063/1.2945287
中图分类号
O59 [应用物理学];
学科分类号
摘要
In order to utilize the full potential of solar cells fabricated on n-type silicon, it is necessary to achieve an excellent passivation on B-doped emitters. Experimental studies on test structures and theoretical considerations have shown that a negatively charged dielectric layer would be ideally suited for this purpose. Thus, in this work the negative-charge dielectric Al(2)O(3) was applied as surface passivation layer on high-efficiency n-type silicon solar cells. With this front surface passivation layer, a confirmed conversion efficiency of 23.2% was achieved. For the open-circuit voltage V(oc) of 703.6 mV, the upper limit for the emitter saturation current density J(0e), including the metalized area, has been evaluated to be 29 fA/cm(2). This clearly shows that an excellent passivation of highly doped p-type c-Si can be obtained at the device level by applying Al(2)O(3). (c) 2008 American Institute of Physics.
引用
收藏
页数:3
相关论文
共 23 条
[1]  
ALTERMATT PP, 2006, P 21 EU PVSEC UNPUB, P61106
[2]  
[Anonymous], P 25 IEEE PHOT SPEC
[3]  
[Anonymous], P 14 EUR PHOT SOL EN
[4]  
[Anonymous], P OPF 14 EUR C PHOT
[5]  
BASORE A, 1996, P 25 IEEE PVSC WASH, P377
[6]  
CHEN F, 2007, P 22 EU PVSEC UNPUB, P61106
[7]  
FISCHER B, 2003, THESIS U KONSTANZ, P61106
[8]   Field-effect passivation of the SiO2-Si interface [J].
Glunz, SW ;
Biro, D ;
Rein, S ;
Warta, W .
JOURNAL OF APPLIED PHYSICS, 1999, 86 (01) :683-691
[9]   Minority carrier lifetime degradation in boron-doped Czochralski silicon [J].
Glunz, SW ;
Rein, S ;
Lee, JY ;
Warta, W .
JOURNAL OF APPLIED PHYSICS, 2001, 90 (05) :2397-2404
[10]   Excellent passivation of highly doped p-type Si surfaces by the negative-charge-dielectric Al2O3 [J].
Hoex, B. ;
Schmidt, J. ;
Bock, R. ;
Altermatt, P. P. ;
van de Sanden, M. C. M. ;
Kessels, W. M. M. .
APPLIED PHYSICS LETTERS, 2007, 91 (11)