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Nanoscale composition analysis of atomically flat SrTiO3(001) by friction force microscopy

被引：38
作者：
Iwahori, K
Watanabe, S
Kawai, M
Mizuno, K
Sasaki, K
Yoshimoto, M
机构：
[1] RIKEN, Inst Phys & Chem Res, Wako, Saitama 3510198, Japan
[2] Sci Univ Tokyo, Fac Sci, Dept Phys, Shinjuku Ku, Tokyo, Japan
[3] Tokyo Inst Technol, Mat & Struct Lab, Yokohama, Kanagawa 2268503, Japan
来源：
JOURNAL OF APPLIED PHYSICS | 2000年 / 88卷 / 12期
关键词：
D O I：
10.1063/1.1328065
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
Friction force microscopy (FFM) was used to distinguish the different surface terminations on the nanoscale on atomically flat SrTiO3(001) surfaces, obtained by a combination of ultrasonic agitation and subsequent annealing in air at 1000 degreesC. The surface exhibits atomically flat terraces and sharp steps whose height is 0.2 nm, corresponding to half the height of a unit cell of SrTiO3, or a single atomic layer, where strong friction contrast appears. A compositional analysis of the topmost surface by coaxial-impact-collision ion-scattering spectroscopy (CAICISS) indicated that the friction contrast corresponded to different surface terminations, namely, the SrO and TiO2 layer as a topmost surface, where the TiO2 domain was dominant. This is further supported by the correlation between the compositional Sr/Ti ratio and the area ratio which was observed by CAICISS and FFM, respectively. (C) 2000 American Institute of Physics. [S0021-8979(00)07401-1].
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页码：7099 / 7103
页数：5
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